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dc.contributor.authorTonheim, Celin Russøy
dc.contributor.authorSudbø, Aasmund Sveinung
dc.contributor.authorSelvig, Espen
dc.contributor.authorHaakenaasen, Randi
dc.date.accessioned2017-11-07T07:33:27Z
dc.date.accessioned2017-11-08T10:15:14Z
dc.date.available2017-11-07T07:33:27Z
dc.date.available2017-11-08T10:15:14Z
dc.date.issued2011
dc.identifier.citationTonheim CR, Sudbø AS, Selvig E, Haakenaasen R. Enhancement in Light Emission From Hg-Cd-Te Due to Surface Patterning. IEEE Photonics Technology Letters. 2011;23(1):36-38en_GB
dc.identifier.urihttp://hdl.handle.net/20.500.12242/783
dc.identifier.urihttps://ffi-publikasjoner.archive.knowledgearc.net/handle/20.500.12242/783
dc.descriptionTonheim, Celin Russøy; Sudbø, Aasmund Sveinung; Selvig, Espen; Haakenaasen, Randi. Enhancement in Light Emission From Hg-Cd-Te Due to Surface Patterning. IEEE Photonics Technology Letters 2011 ;Volum 23.(1) s. 36-38en_GB
dc.description.abstractEnhancement of light emission from HgCdTe due to surface patterning has been studied by means of photoluminescence (PL) spectroscopy. A triangular pattern of circular holes was etched into the CdTe layer grown on top of HgCdTe thin-film and multiple quantum well samples. Two different pattern lattice constants were used, giving lattice constant aG to emission wavelength ratios of 0.9, 1.2, and 2.1. The surface pattern was found to give 26%-35% enhancement in measured PL intensity.en_GB
dc.language.isoenen_GB
dc.subjectTermSet Emneord::Lysforsterkere
dc.subjectTermSet Emneord::Optikk
dc.subjectTermSet Emneord::Laser
dc.titleEnhancement in Light Emission From Hg-Cd-Te Due to Surface Patterningen_GB
dc.typeArticleen_GB
dc.date.updated2017-11-07T07:33:27Z
dc.identifier.cristinID828243
dc.identifier.cristinID828243
dc.identifier.doi10.1109/LPT.2010.2090517
dc.source.issn1041-1135
dc.source.issn1941-0174
dc.type.documentJournal article
dc.relation.journalIEEE Photonics Technology Letters


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